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Keysight Nano Indenter G200

The Nano Indenter G200 is the most accurate, flexible, user-friendly instrument for nanomechanical testing. Electromagnetic actuation allows unparalleled dynamic range in force and displacement and measurement of deformation over six orders of magnitude (from nanometers to millimeters). Applications include semiconductor, thin films, and MEMs (wafer applications); hard coatings and DLC films; composite materials, fibers, and polymers; metals and ceramics; and biomaterials and biology.


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Data Sheet

Brochure

G200
Key Features & Specifications

  • Results compliant with ISO 14577
  • Electromagnetic actuation for unparalleled dynamic range
  • Flexibility, upgradability for repeatable or new applications
  • Dynamic properties characterization via CSM by indent depth
  • Real-time control, easy protocol development, drift compensation




Keysight Nano Indenter G300

The Nano Indenter G300 utilizes a stage that supports samples with diameters up to 300 mm. An excellent long-term investment for industrial users, it provides a fast, reliable method for acquiring mechanical data on uncut silicon wafers. The G300 permits testing of multiple layers, facilitating product development and failure analysis which can have a significant effect on yield, performance and longevity to devices.

Electromagnetic actuation allows unparalleled dynamic range in force and displacement. It enables measurement of deformation over six orders of magnitude from nanometers to millimeters.


Request a Quote Contact for more info

Data Sheet

Brochure

G300
Key Features & Specifications

  • Results compliant with ISO 14577
  • Sample stage for specimens with dia. up to 300 mm
  • Full testing automation lets instrument run unattended
  • Flexibility, upgradability for repeatable or new applications
  • Dynamic properties characterization via CSM by indent depth
  • Real-time control, easy protocol development, drift compensation



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