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Keysight 7500 AFM

The Keysight 7500 AFM/SPM establishes new performance, versatility, and ease-of-use benchmarks for nanoscale measurement, characterization, and manipulation. The 90 um AFM closed scanner achieves outstanding low noise performance, enabling atomic-resolution imaging. The 7500 is ideal for materials science, life science, polymer science, electrochemistry, electrical characterization, and nanolithography applications.

The 7500 offers excellent closed-loop resolution, leading environmental and temperature control, and an wide- range of electrochemistry capabilities. The 7500 scanner’s standard nose cone permits many AFM techniques, including Keysight’s patented MAC Mode. Easy-to-load nose cones for additional AFM techniques can be interchanged quickly and conveniently. Single-pass nanoscale electrical characterization is achievable using MAC Mode III. For ultimate experimental control, the 7500 automatically identifies connected accessories via hot plug technology.


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Data Sheet

Brochure

7500
Key Features & Specifications

  • Atomic-resolution imaging with closed-loop 90μm scanner
  • Exceptional environmental and temperature control
  • Standard nose cone supports expanded set of imaging modes
  • Superior scanning in fluids, gases, and ambient conditions
  • Unprecedented electrochemistry (EC) capabilities




Keysight 7500ILM AFM

Keysight’s 7500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope (AFM) with the direct optical viewing capability of an inverted optical microscope.

The Keysight ILM offers unparalleled performance and ease of use for imaging in fluids. It extends AFM utility in order to encompass studies of single molecules, polymers, cell membranes, whole cells, and much more. Atomic force and optical (or fluorescence) microscopy data can be obtained simultaneously with the Keysight ILM.

The rigid stage structure provides the low noise floor needed to obtain sub-nanometer resolution. Furthermore, the advanced design allows the AFM to sit on top of an inverted microscope and under the illumination pillar, resulting in better optical contrast for the images.


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Data Sheet

Brochure

7500ILM
Key Features & Specifications

  • High-resolution atomic force microscope on an inverted optical microscope allows simultaneous AFM and fluorescence imaging
  • Top-down scanner design enables effortless setup
  • Inverted optical view, open-top viewing access, and top illumination provide superior optical contrast
  • Rigid stage mounting provides low noise floor for sub-nanometer resolution
  • Patented MAC Mode option provides gentlest, nondestructive AFM imaging of samples in fluid
  • PicoTREC option delivers real-time, simultaneous topography and recognition imaging
  • Sample-handling plates available to facilitate easy imaging in fluids or ambient air
  • Easy Quick Slide sample-loading mechanism makes sample preparation simple




Keysight 5500 AFM

The Keysight 5500 AFM/SPM microscope offers numerous unique features, such as patented top-down scanning and unrivalled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with our unique sample plates designed for your application including imaging in fluids.

A top-down optical axis through the scanner allows an unobstructed view of the cantilever and the sample without sacrificing sample handling. The scanner’s modular nose cone makes changing imaging modes quick and easy. The 5500 SPM/AFM is a high performance system that facilitates advanced applications solutions. It offers atomic resolution and is ideal for electrochemistry, polymers, and soft material applications.


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Data Sheet

Brochure

5500
Key Features & Specifications

  • Highly modular microscope and scanner
  • Optional Integrated environmental & temperature control
  • Easy fluid operation with open cell
  • Easy sample access with top-down scanning




Keysight 5600LS AFM

Whether you work with large or small samples, the Keysight 5600LS large-stage AFM is ready to deliver the atomic-resolution results you need. The modular 5600LS is the world’s finest commercially available AFM system that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with a 9μm scanner.

The 5600LS utilizes the largest fully addressable and programmable stage on the market, 200 mm x 200 mm, as well as a low-noise AFM design. Samples up to 8” in diameter and 30mm tall are easily accepted by the 200mm vacuum chuck. The stage accommodates a 300mm wafer with repositioning.

To further expand the application versatility of the 5600LS system, new 300mm x 300mm and multi-sample 2-inch-wafer stages are now available. The 5600LS AFM provides researchers a perfect tool for many nanotechnology applications, including semiconductor, optoelectronics, materials science, and life science studies.


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Data Sheet

Brochure

5600LS
Key Features & Specifications

  • New 300mm x 300mm and multi-sample 2-inch-wafer stages expand application versatility
  • Largest fully addressable and programmable stage on market (200 mm x 200 mm)
  • Special stage adapter allows use of sample plate to image small samples in liquid
  • System provides simple point-and-shoot AFM imaging based on optical view
  • Atomic-resolution imaging of small sample areas via AFM or STM scanners
  • Exclusive SMM mode offers calibrated electrical measurement capabilities




Keysight 5500ILM AFM

The Keysight 5500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope with the direct optical viewing capability of an inverted optical microscope. The system’s advanced design allows the AFM to sit on top of an inverted microscope and under the illumination pillar, resulting in better optical contrast for the images.

The 5500 ILM offers unparalleled performance and ease of use for imaging in fluids or ambient air. It extends AFM utility in order to encompass studies of single molecules, polymers, cell membranes, whole cells, and much more. Atomic force and optical (or fluorescence) microscopy data can be obtained simultaneously with the Keysight ILM.


Request a Quote Contact for more info

Data Sheet

Brochure

5500ILM
Key Features & Specifications

  • System optimized for simultaneous AFM and fluorescence imaging
  • Top-down scanner design enables virtually effortless setup
  • Inverted view and top illumination provide superior optical contrast
  • Sample-handling plates facilitate easy imaging in fluids or ambient air



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